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Effect of oxide thickness on the capacitance and conductance characteristics of MOS structures
N. Tuğluoğlu, S. Karadeniz, A. Birkan Selçuk, S. Bilge OcakVolume:
400
Year:
2007
Language:
english
Pages:
7
DOI:
10.1016/j.physb.2007.07.004
File:
PDF, 245 KB
english, 2007