Observation of vacancy in crystalline silicon using...

Observation of vacancy in crystalline silicon using low-temperature ultrasonic measurements

Terutaka Goto, Hiroshi Yamada-Kaneta, Koji Sato, Masatoshi Hikin, Yuichi Nemoto, Shintaro Nakamura
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Volume:
401-402
Year:
2007
Language:
english
Pages:
6
DOI:
10.1016/j.physb.2007.08.124
File:
PDF, 1.03 MB
english, 2007
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