Distribution of electrically active nickel atoms in silicon crystals measured by means of deep level transient spectroscopy
Shuji Tanaka, Hajime KitagawaVolume:
401-402
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.physb.2007.08.125
File:
PDF, 207 KB
english, 2007