Distribution of electrically active nickel atoms in silicon...

Distribution of electrically active nickel atoms in silicon crystals measured by means of deep level transient spectroscopy

Shuji Tanaka, Hajime Kitagawa
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Volume:
401-402
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.physb.2007.08.125
File:
PDF, 207 KB
english, 2007
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