Thermal stability of Co, Ni, Pt or Ru Schottky contacts on n-Si and defects introduced thereon during contacts fabrication using electron beam deposition
Cloud Nyamhere, A. Chawanda, A.G.M. Das, F.D. Auret, M. HayesVolume:
401-402
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.physb.2007.08.152
File:
PDF, 264 KB
english, 2007