Atomistic structure of stacking faults in a commercial...

Physica B: Condensed Matter 2007 Vol. 401-402; Iss. none

Atomistic structure of stacking faults in a commercial GaAs:Si wafer revealed by cross-sectional scanning tunneling microscopy

Y. Ohno, T. Taishi, I. Yonenaga, S. Takeda
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Volume:
401-402
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.physb.2007.08.154
File:
PDF, 654 KB
english, 2007
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