Optical characterization studies of grown-in defects in ZnO epilayers grown by molecular beam epitaxy
X.J. Wang, I.A. Buyanova, W.M. Chen, C.J. Pan, C.W. TuVolume:
401-402
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.physb.2007.08.200
File:
PDF, 419 KB
english, 2007