Properties and identification of the oxygen-related...

Properties and identification of the oxygen-related radiation defects in silicon

Nikolai Yarykin, Jörg Weber
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Volume:
401-402
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.physb.2007.09.004
File:
PDF, 150 KB
english, 2007
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