A study of the dependence of electron-induced defects on the doping impurity density in n-type germanium by deep-level transient spectroscopy (DLTS)
Cloud Nyamhere, F.D. Auret, A.G.M. Das, A. ChawandaVolume:
401-402
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.physb.2007.09.008
File:
PDF, 167 KB
english, 2007