Control of the stacking fault areas in pseudomorphic ZnSe layers by photo-molecular beam epitaxy
Y. Ohno, T. Taishi, I. Yonenaga, S. Ichikawa, R. Hirai, S. TakedaVolume:
401-402
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.physb.2007.09.043
File:
PDF, 342 KB
english, 2007