Application of DLTS and Laplace-DLTS to defect characterization in high-resistivity semiconductors
L.F. Makarenko, J.H. Evans-FreemanVolume:
401-402
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.physb.2007.09.047
File:
PDF, 158 KB
english, 2007