Rattling “guest” impurities in Si and Ge clathrate semiconductors
Charles W. Myles, Koushik Biswas, Emmanuel NenghabiVolume:
401-402
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.physb.2007.09.054
File:
PDF, 265 KB
english, 2007