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TEM observations in Si: An attempt to link deformation microstructures and electrical activity
D. Eyidi, V. Eremenko, J.L. Demenet, J. RabierVolume:
404
Year:
2009
Language:
english
Pages:
3
DOI:
10.1016/j.physb.2009.08.134
File:
PDF, 188 KB
english, 2009