![](/img/cover-not-exists.png)
Charge carrier removal rates in n-type silicon and silicon carbide subjected to electron and proton irradiation
V.V. Kozlovski, V.V. Emtsev, A.M. Ivanov, A.A. Lebedev, G.A. Oganesyan, D.S. Poloskin, N.B. StrokanVolume:
404
Year:
2009
Language:
english
Pages:
3
DOI:
10.1016/j.physb.2009.08.191
File:
PDF, 202 KB
english, 2009