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Structural distortions induced during stress relaxation affecting electrical transport of nanometer-thick La0.67(Ba,Ca)0.33MnO3 films
I.T. Serenkov, V.I. Sakharov, Yu. A. Boikov, V.A. Danilov, M.P. Volkov, T. ClaesonVolume:
404
Year:
2009
Language:
english
Pages:
3
DOI:
10.1016/j.physb.2009.08.286
File:
PDF, 386 KB
english, 2009