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Combined SANS–SESANS, from 1 nm to 0.1 mm in one instrument
Wim G. Bouwman, Chris P. Duif, Jeroen Plomp, Albrecht Wiedenmann, Roland GählerVolume:
406
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.physb.2010.11.069
File:
PDF, 338 KB
english, 2011