Opportunities and limits of Hil-tests

Opportunities and limits of Hil-tests

Horst Krimmel,Oliver Maschmann,Steffen Seidt,Dominik Vogt
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Volume:
1
Language:
english
Journal:
ATZelektronik worldwide
DOI:
10.1007/BF03242097
Date:
December, 2006
File:
PDF, 145 KB
english, 2006
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