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[IEEE 2009 Proceedings of ESSCIRC (ESSCIRC) - Athens, Greece (2009.09.14-2009.09.18)] 2009 Proceedings of ESSCIRC - Performance, reliability, radiation effects, and aging issues in microelectronics — from atomic-scale physics to engineering-level modeling
Pantelides, Sokrates T., Tsetseris, L., Beck, M. J., Rashkeev, S. N., Hadjisavvas, G., Batyrev, I. G., Tuttle, B. R., Marinopoulos, A. G., Zhou, X. J., Fleetwood, D. M., Schrimpf, R. D.Year:
2009
Language:
english
DOI:
10.1109/esscirc.2009.5325931
File:
PDF, 1.63 MB
english, 2009