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[IEEE 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - Vienna, Austria (2010.04.14-2010.04.16)] 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - On analysis of fabricated polymorphic circuits
Simek, Vaclav, Ruzicka, Richard, Sekanina, LukasYear:
2010
Language:
english
DOI:
10.1109/ddecs.2010.5491769
File:
PDF, 382 KB
english, 2010