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[IEEE 2013 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) - Daerah Langkawi, Malaysia (2013.09.25-2013.09.27)] RSM 2013 IEEE Regional Symposium on Micro and Nanoelectronics - Investigating the annealing effect on the conventional growth of ZnO nanorod through electrical characterization
Prasad, R. Haarindra, Hashim, U., Foo, K.L., Shafiq, MohdYear:
2013
Language:
english
DOI:
10.1109/rsm.2013.6706536
File:
PDF, 380 KB
english, 2013