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[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - Wafer-scale flexible graphene strain sensors

Tian, He, Yang, Yi, Xie, Dan, Shu, Yi, Cui, Ya-Long, Wu, Can, Cai, Hua-Lin, Ren, Tian-Ling
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Year:
2013
Language:
english
DOI:
10.1109/iedm.2013.6724632
File:
PDF, 4.27 MB
english, 2013
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