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[IEEE 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2011.11.7-2011.11.10)] 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Full-chip runtime error-tolerant thermal estimation and prediction for practical thermal management
Wang, Hai, Tan, Sheldon X.-D., Liao, Guangdeng, Quintanilla, Rafael, Gupta, AshishYear:
2011
Language:
english
DOI:
10.1109/iccad.2011.6105408
File:
PDF, 1.15 MB
english, 2011