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[IEEE Twenty Seventh Annual IEEE/CPMT/SEMI International Electronics Manufacturing Technology Symposium - San Jose, CA, USA (17-18 July 2002)] 27th Annual IEEE/SEMI International Electronics Manufacturing Technology Symposium - Improving yield, productivity, and quality in test assembly and packaging through direct part marking and unit level traceability
Agapakis, J., Figarella, L.Year:
2002
Language:
english
DOI:
10.1109/iemt.2002.1032743
File:
PDF, 391 KB
english, 2002