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[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Applying S-graphs for modeling metrological support and control systems
Palchun, Yu. A., Yelistratova, I. B., Yakimova, I. V., Zemtsov, C. P., Kvitkova, I. G.Year:
2012
Language:
english
DOI:
10.1109/apeie.2012.6629146
File:
PDF, 431 KB
english, 2012