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[IEEE 2004 International Conference on Communications, Circuits and Systems - Chengdu, China (27-29 June 2004)] 2004 International Conference on Communications, Circuits and Systems (IEEE Cat. No.04EX914) - AL/RTL co-modeling and general test generation
Weimin Wu,, Ming Zhu,, Jiangzhou Zhao,, Jinian Bian,Year:
2004
Language:
english
DOI:
10.1109/icccas.2004.1346417
File:
PDF, 343 KB
english, 2004