[IEEE 2011 IEEE International Symposium on Electromagnetic Compatibility - EMC 2011 - Long Beach, CA, USA (2011.08.14-2011.08.19)] 2011 IEEE International Symposium on Electromagnetic Compatibility - A novel common mode choke and its application for 5 Gbps USB 3.0
Tsai, Chung-Hao, Hsu, Jing-Zuei, Ieong, Iat-In Ao, Wu, Tzong-LinYear:
2011
Language:
english
DOI:
10.1109/ISEMC.2011.6038434
File:
PDF, 2.41 MB
english, 2011