[IEEE 2013 IEEE International Symposium on Electromagnetic Compatibility - EMC 2013 - Denver, CO, USA (2013.08.5-2013.08.9)] 2013 IEEE International Symposium on Electromagnetic Compatibility - A novel measurement fixture for characterizing USB 3.0 radio frequency interference
Chen, Chung-hao, Davuluri, Pujitha, Han, Dong-hoYear:
2013
Language:
english
DOI:
10.1109/ISEMC.2013.6670513
File:
PDF, 1.05 MB
english, 2013