International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
2014 / 09 Vol. 27; Iss. 5-6
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Analysis of the RF and noise performance of junctionless MOSFETs using Monte Carlo simulation
Chen, Yongbo, Xu, RuiminVolume:
27
Language:
english
Journal:
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
DOI:
10.1002/jnm.1938
Date:
September, 2014
File:
PDF, 983 KB
english, 2014