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[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Hot Carrier Reliability of Strained N-Mosfet with Lattice Mismatched Source/Drain Stressors
Ang, Kah-Wee, Wan, Chunlei, Chui, King-Jien, Tung, Chih-Hang, Balasubramanian, N., Li, Ming-Fu, Samudra, Ganesh, Yeo, Yee-ChiaYear:
2007
Language:
english
DOI:
10.1109/relphy.2007.369569
File:
PDF, 696 KB
english, 2007