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[IEEE 2014 15th Latin American Test Workshop - LATW - Fortaleza, Brazil (2014.3.12-2014.3.15)] 2014 15th Latin American Test Workshop - LATW - Possibilities of defect-size magnification for testing resistive-opens in nanometer technologies

Garcia-Gervacio, Jose L., Martinez-Castillo, Jaime, Champac, Victor
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Year:
2014
Language:
english
DOI:
10.1109/latw.2014.6841909
File:
PDF, 171 KB
english, 2014
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