[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Case Study: Efficient SDD test generation for very large integrated circuits
Peng, Ke, Fang Bao,, Shofner, Geoff, Winemberg, LeRoy, Tehranipoor, MohammadYear:
2011
Language:
english
DOI:
10.1109/vts.2011.5783759
File:
PDF, 791 KB
english, 2011