![](/img/cover-not-exists.png)
[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - A new stretched-exponential model for NBTI effects in pMOSFETs
Cao, Jian-Min, He, Wei, Zhao, Xiao-JinYear:
2012
DOI:
10.1109/icsict.2012.6467759
File:
PDF, 150 KB
2012