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[IEEE 2008 7th IEEE International Conference on Cybernetic Intelligent Systems (CIS) - London, UK (2008.09.9-2008.09.10)] 2008 7th IEEE International Conference on Cybernetic Intelligent Systems - Intelligent system for material quality control using impact-echo testing
Salazar, Addisson, Serrano, Arturo, Vergara, Luis, Miralles, RamonYear:
2008
Language:
english
DOI:
10.1109/ukricis.2008.4798954
File:
PDF, 1.76 MB
english, 2008