A short-term high-current-density reliability investigation of AlGaAs/GaAs heterojunction bipolar transistors
Bovolon, N., Schultheis, R., Muller, J.-E., Zwicknagl, P., Zanoni, E.Volume:
19
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/55.735749
Date:
December, 1998
File:
PDF, 79 KB
english, 1998