High-resolution in situ electron microscopy of a silicon...

High-resolution in situ electron microscopy of a silicon surface modification by molten aluminium at high temperatures

Tsukimoto, S., Arai, S., Saka, H.
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Volume:
79
Language:
english
Journal:
Philosophical Magazine Letters
DOI:
10.1080/095008399176508
Date:
December, 1999
File:
PDF, 1.28 MB
english, 1999
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