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[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - A distributed architecture to check global properties for post-silicon debug
Larsson, Erik, Vermeulen, Bart, Goossens, KeesYear:
2010
Language:
english
DOI:
10.1109/etsym.2010.5512760
File:
PDF, 409 KB
english, 2010