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[IEEE 1982 IEEE International Solid-State Circuits Conference - San Francisco, CA, USA (1982.02.10-1982.02.12)] 1982 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - A 256K dynamic MOS RAM with alpha immune and redundancy
Ishihara, M., Matsumoto, T., Shimizu, S., Mitsusada, K., Shimohigashi, K., Mano, T.Year:
1982
Language:
english
DOI:
10.1109/isscc.1982.1156374
File:
PDF, 338 KB
english, 1982