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Characterization of EFG silicon ribbons by ion beam techniques
M. Hage-Ali, R. Stuck, M. Toulemonde, P. SiffertVolume:
1
Year:
1980
Language:
english
Pages:
5
DOI:
10.1016/0379-6787(80)90044-7
File:
PDF, 218 KB
english, 1980