[IEEE 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC 2009) - Xi'an (2009.12.25-2009.12.27)] 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Performance analysis of dual-material gate SOI MOSFET
Hongxia Liu,, Qianwei Kuang,, Suzhen Luan,, Yue Hao,Year:
2009
Language:
english
DOI:
10.1109/edssc.2009.5394188
File:
PDF, 1.56 MB
english, 2009