[IEEE 2013 81st ARFTG Microwave Measurement Conference (ARFTG) - Seattle, WA, USA (2013.06.7-2013.06.7)] 81st ARFTG Microwave Measurement Conference - Residual errors in coplanar on-chip 1-port calibration caused by standard deviations
Berndt, Sebastian, Mrosk, Till, Doerner, Ralf, Lenk, FriedrichYear:
2013
Language:
english
DOI:
10.1109/arftg.2013.6579054
File:
PDF, 144 KB
english, 2013