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[IEEE 2010 IEEE Custom Integrated Circuits Conference -CICC 2010 - San Jose, CA, USA (2010.09.19-2010.09.22)] IEEE Custom Integrated Circuits Conference 2010 - Improving SRAM Vmin and yield by using variation-aware BTI stress
Wang, Jiajing, Nalam, Satyanand, Zhenyu Qi,, Mann, Randy W., Stan, Mircea, Calhoun, Benton H.Year:
2010
Language:
english
DOI:
10.1109/cicc.2010.5617631
File:
PDF, 168 KB
english, 2010