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[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - Scan based speed-path debug for a microprocessor
Zeng, Jing, Guo, Ruifeng, Cheng, Wu-Tung, Mateja, Michael, Wang, Jing, Tsai, Kun-Han, Amstutz, KenYear:
2010
Language:
english
DOI:
10.1109/etsym.2010.5512756
File:
PDF, 858 KB
english, 2010