Multi-resolution wavelet analysis for chopped impulse...

IEEE Transactions on Dielectrics and Electrical Insulation 2008 / 06 Vol. 15; Iss. 3

Multi-resolution wavelet analysis for chopped impulse voltage measurements and feature extraction

Onal, Emel, Kalenderli, Ozcan, Seker, Serhat
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Volume:
15
Language:
english
Journal:
IEEE Transactions on Dielectrics and Electrical Insulation
DOI:
10.1109/tdei.2008.4543128
Date:
June, 2008
File:
PDF, 956 KB
english, 2008
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