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[IEEE 2012 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Technology, System and Application - Body effect induced variability in Bulk tri-gate MOSFETs
Chun-Hsien Chiang,, Ming-Long Fan,, Kuo, J. J-Y, Pin Su,Year:
2012
Language:
english
DOI:
10.1109/vlsi-tsa.2012.6210130
File:
PDF, 327 KB
english, 2012