[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - At speed HTOL test for reliability qualification of high speed mobile applications
Jongwoo Park,, Da Ahn,, Donghee Lee,, Jang, E.-S, Wooyeon Kim,, Sangchul Shin,, Gunrae Kim,, Nae-In Lee,, Sangwoo Pae,Year:
2013
Language:
english
DOI:
10.1109/irps.2013.6531995
File:
PDF, 956 KB
english, 2013