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The Simulation of damage tracks in silicon
Messenger, S.R., Burke, E.A., Xapsos, M.A., Summers, G.P., Walters, R.J.Volume:
51
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2004.835094
Date:
October, 2004
File:
PDF, 165 KB
english, 2004