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Variations in the electrical short-circuit current decay for recombination lifetime and velocity measurements
Tae-Won Jung, Fredrik A. Lindholm, Arnost NeugroschelVolume:
22
Year:
1987
Language:
english
Pages:
16
DOI:
10.1016/0379-6787(87)90048-2
File:
PDF, 708 KB
english, 1987