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[IEEE 2008 1st Microsystems and Nanoelectronics Research Conference (MNRC 2008) - Ottawa, ON, Canada (2008.10.15-2008.10.15)] 2008 1st Microsystems and Nanoelectronics Research Conference - Single-Event-Transient tolerant comparators with auto-zeroing techniques
Tao Wang,, Li Chen,, Dinh, Anh, Teng, DanielYear:
2008
Language:
english
DOI:
10.1109/mnrc.2008.4683366
File:
PDF, 295 KB
english, 2008