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[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Evidence for Pb center-hydrogen complexes after subjecting PMOS devices to NBTI stress - A combined DCIV/SDR study
Aichinger, Thomas, Lenahan, Patrick M., Grasser, Tibor, Pobegen, Gregor, Nelhiebel, MichaelYear:
2012
Language:
english
DOI:
10.1109/irps.2012.6241932
File:
PDF, 635 KB
english, 2012