Parametric Testing of HYPRES Superconducting Integrated...

IEEE Transactions on Appiled Superconductivity 2007 / 06 Vol. 17; Iss. 2

Parametric Testing of HYPRES Superconducting Integrated Circuit Fabrication Processes

Yohannes, D.., Kirichenko, A.., Sarwana, S.., Tolpygo, S.K.
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Volume:
17
Language:
english
Journal:
IEEE Transactions on Applied Superconductivity
DOI:
10.1109/tasc.2007.897399
Date:
June, 2007
File:
PDF, 301 KB
english, 2007
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