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Filament Formation in an Electrochemical SiO2-Based Memory Device During the Forming Process
Liu, Chih-Yi, Lin, Chao-HanVolume:
35
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2014.2330204
Date:
August, 2014
File:
PDF, 795 KB
english, 2014